Advanced Processing and Characterization Technologies
Effect of Window Diffusion Stripe Structure on Reduction of Temperature Rise at Laser Facet Aklhlro Shlma, Yoshihiro Kokubo and Masao Alga Optoelectronic aamp; Microwave Devices Raamp;D Laboratory Mitsubishi Electric Corporation 4-1, Mizuhara, Itami Hyogo, 664 Japan 1. Introduction Recently ... Figure 1 shows a schematic diagram of the system for the measurement of the temperature at the laser mirror.
| Title | : | Advanced Processing and Characterization Technologies |
| Author | : | Paul H. Holloway |
| Publisher | : | Amer Inst of Physics - 1991 |
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